Radiation damage bigger problem in microelectronics than previously thought

David Salisbury
EurekAlert

The amount of structural damage that radiation causes in electronic materials at the atomic level may be at least ten times greater than previously thought.

That is the surprising result of a new characterization method that uses a combination of lasers and acoustic waves to provide scientists with a capability tantamount to X-ray vision: It allows them to peer through solid materials to pinpoint the size and location of detects buried deep inside with unprecedented precision.

The research, which was conducted by post-doctoral fellow Andrew Steigerwald under the supervision of Physics Professor Norman Tolk, was published online on July 19 in the Journal of Applied Physics.

Read More: Radiation damage bigger problem in microelectronics than previously thought

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